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A rational foundation for software metrology /

Bibliographic Details
Main Author: Flater, David
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Black, Paul E., Fong, Elizabeth, Kacker, Raghy, Kuhn, D. Richard, Okum, Vadim, Wood, Stephen
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
Series:NISTIR ; 8101.
Subjects:
Computer software.
Metrology.
Online Access:https://purl.fdlp.gov/GPO/gpo96077
Description
Item Description:Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
January 2016.
Title from PDF title page (viewed January 31, 2016).
Physical Description:1 online resource (ii, 38 pages) : illustrations (chiefly color).
Bibliography:Includes bibliographical references.