A rational foundation for software metrology /

Bibliographic Details

Main Author:	Flater, David
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Black, Paul E., Fong, Elizabeth, Kacker, Raghy, Kuhn, D. Richard, Okum, Vadim, Wood, Stephen
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.
Series:	NISTIR ; 8101.
Subjects:	Computer software. Metrology.
Online Access:	https://purl.fdlp.gov/GPO/gpo96077