APA (7th ed.) Citation

Flater, D., Black, P. E., Fong, E., Kacker, R., Kuhn, D. R., Okum, V., & Wood, S. (2016). A rational foundation for software metrology. U.S. Dept. of Commerce, National Institute of Standards and Technology.

Chicago Style (17th ed.) Citation

Flater, David, Paul E. Black, Elizabeth Fong, Raghy Kacker, D. Richard Kuhn, Vadim Okum, and Stephen Wood. A Rational Foundation for Software Metrology. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.

MLA (9th ed.) Citation

Flater, David, et al. A Rational Foundation for Software Metrology. U.S. Dept. of Commerce, National Institute of Standards and Technology, 2016.