Cover Image

Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise /

Bibliographic Details
Main Author: Geist, Jon
Corporate Author: Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.)). Semiconductor and Dimensional Metrology Division
Other Authors: Afridi, M. Yaqub
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
Series:NISTIR ; 8073.
Subjects:
Data collection systems.
Frequencies of oscillating systems.
Online Access:https://purl.fdlp.gov/GPO/gpo99585

Similar Items