Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise /

Bibliographic Details

Main Author:	Geist, Jon
Corporate Author:	Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.)). Semiconductor and Dimensional Metrology Division
Other Authors:	Afridi, M. Yaqub
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.
Series:	NISTIR ; 8073.
Subjects:	Data collection systems. Frequencies of oscillating systems.
Online Access:	https://purl.fdlp.gov/GPO/gpo99585