APA (7th ed.) Citation

Geist, J., & Afridi, M. Y. (2015). Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1: Frequency offset, random, quantization, and jitter noise. U.S. Dept. of Commerce, National Institute of Standards and Technology.

Chicago Style (17th ed.) Citation

Geist, Jon, and M. Yaqub Afridi. Simulated Sinewave Testing of Data Acquisition Systems Using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.

MLA (9th ed.) Citation

Geist, Jon, and M. Yaqub Afridi. Simulated Sinewave Testing of Data Acquisition Systems Using Sine Fitting and Discrete Fourier Transform Methods Part 1: Frequency Offset, Random, Quantization, and Jitter Noise. U.S. Dept. of Commerce, National Institute of Standards and Technology, 2015.