Cover Image

A measurement metric for forensic latent fingerprint preprocessing /

Bibliographic Details
Corporate Author: National Institute of Standards and Technology (U.S.). Information Technology Laboratory, Material Measurement Laboratory
Other Authors: Dienstfrey, Andrew, Guan, Haiying, Stanton, Brian, Theofanos, Mary
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
Series:NISTIR ; 8017.
Subjects:
Fingerprints.
Online Access:https://purl.fdlp.gov/GPO/gpo96721
Description
Item Description:Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
July 2014.
Title from PDF title page (viewed July 23, 2014).
Physical Description:1 online resource (42 pages) : illustrations (black and white).
Bibliography:Includes bibliographical references.