A measurement metric for forensic latent fingerprint preprocessing /

Bibliographic Details

Corporate Author:	National Institute of Standards and Technology (U.S.). Information Technology Laboratory, Material Measurement Laboratory
Other Authors:	Dienstfrey, Andrew, Guan, Haiying, Stanton, Brian, Theofanos, Mary
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
Series:	NISTIR ; 8017.
Subjects:	Fingerprints.
Online Access:	https://purl.fdlp.gov/GPO/gpo96721