APA (7th ed.) Citation

National Institute of Standards and Technology (U.S.). Information Technology Laboratory, Material Measurement Laboratory, Dienstfrey, A., Guan, H., Stanton, B., & Theofanos, M. (2014). A measurement metric for forensic latent fingerprint preprocessing. U.S. Dept. of Commerce, National Institute of Standards and Technology.

Chicago Style (17th ed.) Citation

National Institute of Standards and Technology (U.S.). Information Technology Laboratory, Material Measurement Laboratory, Andrew Dienstfrey, Haiying Guan, Brian Stanton, and Mary Theofanos. A Measurement Metric for Forensic Latent Fingerprint Preprocessing. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.

MLA (9th ed.) Citation

National Institute of Standards and Technology (U.S.). Information Technology Laboratory, Material Measurement Laboratory, et al. A Measurement Metric for Forensic Latent Fingerprint Preprocessing. U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.