Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.)). Semiconductor and Dimensional Metrology Division, Blackburn, C., Hudlemeyer, A., Lee, V. D., Meruet, M., Muralikrishnan, B., & Sawyer, D. (2014). A proposed interim check for field testing a laser tracker's 3-D length measurement capability using a calibrated scale bar as a reference artifact. U.S. Dept. of Commerce, National Institute of Standards and Technology.
Chicago Style (17th ed.) CitationPhysical Measurement Laboratory (National Institute of Standards and Technology (U.S.)). Semiconductor and Dimensional Metrology Division, Christopher Blackburn, Aaron Hudlemeyer, Vincent D. Lee, Mark Meruet, Bala Muralikrishnan, and Daniel Sawyer. A Proposed Interim Check for Field Testing a Laser Tracker's 3-D Length Measurement Capability Using a Calibrated Scale Bar as a Reference Artifact. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
MLA (9th ed.) CitationPhysical Measurement Laboratory (National Institute of Standards and Technology (U.S.)). Semiconductor and Dimensional Metrology Division, et al. A Proposed Interim Check for Field Testing a Laser Tracker's 3-D Length Measurement Capability Using a Calibrated Scale Bar as a Reference Artifact. U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.