ELFT-EFS Evaluation of Latent Fingerprint Technologies : Extended Feature Sets [evaluation #1] /

Bibliographic Details
Main Author: Indovina, M.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Hicklin, R. Austin, Kiebuzinski, G. I.
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
Series:NISTIR ; 7775.
Online Access:https://purl.fdlp.gov/GPO/gpo94753

MARC

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