ELFT-EFS Evaluation of Latent Fingerprint Technologies : Extended Feature Sets [evaluation #1] /

Bibliographic Details

Main Author:	Indovina, M.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Hicklin, R. Austin, Kiebuzinski, G. I.
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
Series:	NISTIR ; 7775.
Online Access:	https://purl.fdlp.gov/GPO/gpo94753