Carasso, A. S., & Vladar, A. E. (2010). Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery. U.S. Dept. of Commerce, National Institute of Standards and Technology.
Chicago Style (17th ed.) CitationCarasso, Alfred S., and Andras E. Vladar. Fractional Diffusion, Low Exponent Levy Stable Laws, and Slow Motion Denoising of Helium Ion Microscope Nanoscale Imagery. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
MLA (9th ed.) CitationCarasso, Alfred S., and Andras E. Vladar. Fractional Diffusion, Low Exponent Levy Stable Laws, and Slow Motion Denoising of Helium Ion Microscope Nanoscale Imagery. U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.