Fractional diffusion, low exponent levy stable laws, and slow motion denoising of helium ion microscope nanoscale imagery /

Bibliographic Details

Main Author:	Carasso, Alfred S.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Vladar, Andras E.
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2010.
Series:	NISTIR ; 7727.
Online Access:	https://purl.fdlp.gov/GPO/gpo103441