Overview of the multiple biometrics grand challenge /

Bibliographic Details

Main Author:	Phillips, Patrick J.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Beveridge, J. R., Bolme, D., Bowyer, K. W., Draper, B., Flynn, P. J. (Patrick J.), Givens, G. H., Lui, Y. M., O'Toole, A., Sahibzada, H. A., Scallan, J. A., Scruggs, W. T., Weimer, S.
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2009.
Series:	NISTIR ; 7607.
Online Access:	https://purl.fdlp.gov/GPO/gpo95501