Overview of the multiple biometrics grand challenge /

Bibliographic Details
Main Author: Phillips, Patrick J.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Beveridge, J. R., Bolme, D., Bowyer, K. W., Draper, B., Flynn, P. J. (Patrick J.), Givens, G. H., Lui, Y. M., O'Toole, A., Sahibzada, H. A., Scallan, J. A., Scruggs, W. T., Weimer, S.
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2009.
Series:NISTIR ; 7607.
Online Access:https://purl.fdlp.gov/GPO/gpo95501

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https://purl.fdlp.gov/GPO/gpo95501

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Call Number: C 13.58:7607
 
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