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Operational measures and accuracies of ROC curve on large fingerprint data sets /

Bibliographic Details
Main Author: Wu, Jin Chu
Corporate Author: National Institute of Standards and Technology (U.S.)
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2008.
Series:NISTIR ; 7495.
Online Access:https://purl.fdlp.gov/GPO/gpo101653

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