Operational measures and accuracies of ROC curve on large fingerprint data sets /

Bibliographic Details

Main Author:	Wu, Jin Chu
Corporate Author:	National Institute of Standards and Technology (U.S.)
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2008.
Series:	NISTIR ; 7495.
Online Access:	https://purl.fdlp.gov/GPO/gpo101653