Matching performance for the US-visit ident system using flat fingerprints /

Bibliographic Details

Main Author:	Wilson, C. L.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Garris, Michael D., Watson, C. I.
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2004.
Series:	NISTIR ; 7110.
Online Access:	https://purl.fdlp.gov/GPO/gpo96105