Conductive atomic force microscopy : applications in nanomaterials /

Bibliographic Details

Corporate Author:	Wiley InterScience (Online service)
Other Authors:	Lanza, Mario (Editor)
Format:	eBook
Language:	English
Published:	Weinheim,Germany : Wiley-VCH, [2017]
Subjects:	Atomic force microscopy. Electronic books.
Online Access:	Connect to the full text of this electronic book