APA (7th ed.) Citation

Woo, D. S. (1982). Characterization of silicon-gate CMOS/SOS integrated circuits processed with ion implantation. George C. Marshall Space Flight Center.

Chicago Style (17th ed.) Citation

Woo, D. S. Characterization of Silicon-gate CMOS/SOS Integrated Circuits Processed with Ion Implantation. Marshall Space Flight Center, AL: George C. Marshall Space Flight Center, 1982.

MLA (9th ed.) Citation

Woo, D. S. Characterization of Silicon-gate CMOS/SOS Integrated Circuits Processed with Ion Implantation. George C. Marshall Space Flight Center, 1982.