Electronics reliability & microminiaturization.

Bibliographic Details
New Title:Microelectronics and reliability
Format: Journal
Language:English
Published: Oxford ; New York : Pergamon Press, -[1963]
Subjects:
Online Availability: Check for online availability

Remote Storage

Holdings details from Remote Storage
Call Number: TK7870 .M456
Notes: Subscription converted to electronic format.
Library Owns: TK7870 .M456 (v.1-2 (1962-1963))
Call Number Status Get It
TK7870 .M456 v.1-2 1962-1963 Available