The detection of doped Cr presence in Sr0.6Ba0.4Nb2O3 by SIMS /

Bibliographic Details

Main Author:	Lee, Unchul (Author)
Format:	Government Document eBook
Language:	English
Published:	Adelphi, MD : Army Research Laboratory, May 1999.
Series:	ARL-TN ; 132.
Subjects:	Photorefractive materials. Secondary ion mass spectrometry.
Online Access:	http://handle.dtic.mil/100.2/ADA363575 https://purl.fdlp.gov/GPO/gpo86512