Measurement techniques for radio frequency nanoelectronics /

Bibliographic Details
Main Authors: Wallis, T. Mitch, 1974- (Author), Kaboš, P. (Pavel) (Author)
Corporate Author: Cambridge University Press
Format: eBook
Language:English
Published: Cambridge, United Kingdom ; New York, NY, USA : Cambridge University Press, 2017.
Series:Cambridge RF and microwave engineering series.
Subjects:
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Call Number: TK6552.5 .W35 2017
 
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TK6552.5 .W35 2017 Available