Cover Image

Measuring deeper learning through cognitively demanding test items : results from the analysis of six national and international exams /

Bibliographic Details
Main Authors: Yuan, Kun (Author), Le, Vi-Nhuan (Author)
Corporate Author: JSTOR (Organization)
Format: eBook
Language:English
Published: Santa Monica, CA : RAND Corporation, [2014]
Series:Research report (Rand Corporation)
Subjects:
Achievement tests > United States.
Critical thinking > Evaluation.
Problem solving > Evaluation.
Written communication > Evaluation.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"Sponsored by the William and Flora Hewlitt Foundation."
Physical Description:1 online resource (xxi, 97 pages).
Bibliography:Includes bibliographical references.
ISBN:9780833085528
0833085522