Measuring deeper learning through cognitively demanding test items : results from the analysis of six national and international exams /

Bibliographic Details
Main Authors: Yuan, Kun (Author), Le, Vi-Nhuan (Author)
Corporate Author: JSTOR (Organization)
Format: eBook
Language:English
Published: Santa Monica, CA : RAND Corporation, [2014]
Series:Research report (Rand Corporation)
Subjects:
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Call Number: LB3060.3 .Y83 2014eb
 
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LB3060.3 .Y83 2014eb Available