Yuan, K., & Le, V. (2014). Measuring deeper learning through cognitively demanding test items: Results from the analysis of six national and international exams. RAND Corporation.
Chicago Style (17th ed.) CitationYuan, Kun, and Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. Santa Monica, CA: RAND Corporation, 2014.
MLA (9th ed.) CitationYuan, Kun, and Vi-Nhuan Le. Measuring Deeper Learning Through Cognitively Demanding Test Items: Results from the Analysis of Six National and International Exams. RAND Corporation, 2014.
Warning: These citations may not always be 100% accurate.