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Electrical impact of SiC structural crystal defects on high electric field devices /

Bibliographic Details
Main Author: Neudeck, Philip G. (Author)
Format: Government Document eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 1999.
Series:NASA technical memorandum ; 1999-209647.
Subjects:
Crystal defects.
Silicon.
Electric fields.
Electrical properties.
Switching.
Online Access:https://purl.fdlp.gov/GPO/gpo84758
Description
Item Description:"December 1999."
"Prepared for the 1999 International Conference on Silicon Carbide and Related Materials sponsored by North Carolina State University, Raleigh, North Carolina, October 10-15, 1999."
"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field"--Report documentation page.
Physical Description:1 online resource (6 pages) : illustrations.
Bibliography:Includes bibliographical references (page 6).