Electrical impact of SiC structural crystal defects on high electric field devices /

Bibliographic Details

Main Author:	Neudeck, Philip G. (Author)
Format:	Government Document eBook
Language:	English
Published:	Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 1999.
Series:	NASA technical memorandum ; 1999-209647.
Subjects:	Crystal defects. Silicon. Electric fields. Electrical properties. Switching.
Online Access:	https://purl.fdlp.gov/GPO/gpo84758