Cover Image

The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling /

Bibliographic Details
Main Authors: Pindera, M.-J. (Marek-Jerzy), 1951- (Author), Aboudi, Jacob, 1935- (Author), Arnold, S. M. (Author)
Format: Government Document eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 1999.
Series:NASA technical memorandum ; 1999-209770.
Subjects:
Interfaces.
Oxide films.
Thickness.
Surface roughness.
Temperature effects.
Stress distribution.
Film thickness.
Online Access:https://purl.fdlp.gov/GPO/gpo85374
Description
Item Description:"December 1999."
"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field"--Report documentation page.
Physical Description:1 online resource (16 pages) : illustrations.
Bibliography:Includes bibliographical references (pages 16-17).