The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling /

Bibliographic Details

Main Authors:	Pindera, M.-J. (Marek-Jerzy), 1951- (Author), Aboudi, Jacob, 1935- (Author), Arnold, S. M. (Author)
Format:	Government Document eBook
Language:	English
Published:	Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 1999.
Series:	NASA technical memorandum ; 1999-209770.
Subjects:	Interfaces. Oxide films. Thickness. Surface roughness. Temperature effects. Stress distribution. Film thickness.
Online Access:	https://purl.fdlp.gov/GPO/gpo85374