Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy /

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

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Bibliographic Details

Main Author:	Voigtländer, Bert (Author)
Format:	Book
Language:	English
Published:	Heidelberg ; New York : Springer, [2015]
Series:	Nanoscience and technology.
Subjects:	Atomic force microscopy. Scanning tunneling microscopy. Rastersondenmikroskopie. Rasterkraftmikroskopie. Rastertunnelmikroskopie.