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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Bibliographic Details
Corporate Authors: Knovel (Firm), Institution of Engineering and Technology
Other Authors: Sun, Yichuang (Editor)
Format: eBook
Language:English
Published: London : Institution of Engineering and Technology, 2008.
Series:IET circuits, devices and systems series ; 19.
Subjects:
Linear integrated circuits > Testing.
Mixed signal circuits > Testing.
Radio frequency integrated circuits > Testing.
Linear Integrated Circuits.
Radio Circuits.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated.
TECHNOLOGY & ENGINEERING > Electronics > Circuits > General.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:Annotation
Item Description:Title from title screen.
Electronic resource.
Physical Description:1 online resource (xx, 389 pages) : illustrations.
Bibliography:Includes bibliographical references and index.
ISBN:9780863419997
0863419992
9781615833153
1615833153