Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Bibliographic Details
Corporate Authors:	Knovel (Firm), Institution of Engineering and Technology
Other Authors:	Sun, Yichuang (Editor)
Format:	eBook
Language:	English
Published:	London : Institution of Engineering and Technology, 2008.
Series:	IET circuits, devices and systems series ; 19.
Subjects:	Linear integrated circuits > Testing. Mixed signal circuits > Testing. Radio frequency integrated circuits > Testing. Linear Integrated Circuits. Radio Circuits. TECHNOLOGY & ENGINEERING > Electronics > Circuits > Integrated. TECHNOLOGY & ENGINEERING > Electronics > Circuits > General. Electronic books.
Online Access:	Connect to the full text of this electronic book

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