Nonlinear transistor model parameter extraction techniques /

Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.

Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Rudolph, Matthias, 1969-, Fager, Christian, Root, David E.
Format: eBook
Language:English
Published: Cambridge, UK ; New York : Cambridge University Press, 2012.
Series:Cambridge RF and microwave engineering series.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.
Item Description:Electronic resource.
Physical Description:1 online resource (xiv, 352 pages) : illustrations.
Bibliography:Includes bibliographical references and index.
ISBN:9781139161268
1139161261
9781139014960
113901496X
1139157442
9781139157445
9781139154659
1139154656
9781139159210
1139159216
1283342359
9781283342353