Nonlinear transistor model parameter extraction techniques /

Achieve accurate and reliable parameter extraction using a broad range of techniques and models provided.

Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Rudolph, Matthias, 1969-, Fager, Christian, Root, David E.
Format: eBook
Language:English
Published: Cambridge, UK ; New York : Cambridge University Press, 2012.
Series:Cambridge RF and microwave engineering series.
Subjects:
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Call Number: TK7871.9 .N66 2012eb
 
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