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Microelectronics failure analysis : desk reference /

Bibliographic Details
Corporate Authors: Knovel (Firm), ASM International, Electronic Device Failure Analysis Society
Other Authors: Ross, Richard J.
Format: eBook
Language:English
Published: Materials Park, Ohio : ASM International, [2011]
Edition:6th ed.
Subjects:
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Defects > Testing > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Electronics > Materials > Testing > Handbooks, manuals, etc.
Electronics > Materials > Defects > Handbooks, manuals, etc.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Section 1. Introduction
  • section 2. Failure analysis process overviews
  • section 3. Failure analysis topics
  • section 4. Fault verification and classification
  • section 5. Localization techniques
  • section 6. Deprocessing and sample preparation
  • section 7. Inspection
  • section 8. Materials analysis
  • section 9. Focused ion beam applications
  • section 10. Management and reference information.