Microelectronics failure analysis : desk reference /

Bibliographic Details
Corporate Authors:	Knovel (Firm), ASM International, Electronic Device Failure Analysis Society
Other Authors:	Ross, Richard J.
Format:	eBook
Language:	English
Published:	Materials Park, Ohio : ASM International, [2011]
Edition:	6th ed.
Subjects:	Microelectronics > Materials > Testing > Handbooks, manuals, etc. Microelectronics > Defects > Testing > Handbooks, manuals, etc. Electronic apparatus and appliances > Testing > Handbooks, manuals, etc. Electronics > Materials > Testing > Handbooks, manuals, etc. Electronics > Materials > Defects > Handbooks, manuals, etc. TECHNOLOGY & ENGINEERING > Electronics > Digital. TECHNOLOGY & ENGINEERING > Electronics > Microelectronics. Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online