Cover Image

Microelectronics failure analysis : desk reference /

Bibliographic Details
Corporate Authors: Knovel (Firm), ASM International, Electronic Device Failure Analysis Society
Other Authors: Ross, Richard J.
Format: eBook
Language:English
Published: Materials Park, Ohio : ASM International, [2011]
Edition:6th ed.
Subjects:
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Defects > Testing > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Electronics > Materials > Testing > Handbooks, manuals, etc.
Electronics > Materials > Defects > Handbooks, manuals, etc.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"ASM International, 2011, number 09110Z"--Page 4 of cover.
Some online versions lack accompanying media packaged with the printed version.
Electronic resource.
Physical Description:1 online resource (xi, 660 pages) : illustrations
Bibliography:Includes bibliographical references and indexes.
ISBN:9781613447598
1613447590
9781615037261
1615037268