Reliability and radiation effects in compound semiconductors /

This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms. It is the first...

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Bibliographic Details
Main Author: Johnston, Allan (Allan H.)
Corporate Author: Knovel (Firm)
Format: eBook
Language:English
Published: Singapore ; Hackensack, NJ : World Scientific, [2010]
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Call Number: TK7871.99.C65 J64 2010eb
 
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