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Properties of porous silicon /

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Bibliographic Details
Corporate Authors: Knovel (Firm), INSPEC (Information service)
Other Authors: Canham, Leigh T.
Format: eBook
Language:English
Published: London : IEE : INSPEC, [1987]
Series:EMIS datareviews series ; no. 18.
Subjects:
Porous silicon.
Semiconductors.
Semiconducteurs.
Optoélectronique.
Silicium.
Matériaux poreux.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xviii, 405 pages) : illustrations.
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and index.
ISBN:1591248582
9781591248583