Properties of porous silicon /

Bibliographic Details

Corporate Authors:	Knovel (Firm), INSPEC (Information service)
Other Authors:	Canham, Leigh T.
Format:	eBook
Language:	English
Published:	London : IEE : INSPEC, [1987]
Series:	EMIS datareviews series ; no. 18.
Subjects:	Porous silicon. Semiconductors. Semiconducteurs. Optoélectronique. Silicium. Matériaux poreux. Electronic books.
Online Access:	Connect to the full text of this electronic book