Knovel (Firm), INSPEC (Information service), & Canham, L. T. (1987). Properties of porous silicon. IEE : INSPEC.
Chicago Style (17th ed.) CitationKnovel (Firm), INSPEC (Information service), and Leigh T. Canham. Properties of Porous Silicon. London: IEE : INSPEC, 1987.
MLA (9th ed.) CitationKnovel (Firm), et al. Properties of Porous Silicon. IEE : INSPEC, 1987.
Warning: These citations may not always be 100% accurate.