Cover Image

Characterization of semiconductor materials : principles and methods /

Show other versions (1)

Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.

Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: McGuire, G. E.
Format: eBook
Language:English
Published: Park Ridge, N.J. : Noyes Publications, [1989-]
Series:Materials science and process technology series.
Subjects:
Semiconductors > Handbooks, manuals, etc.
Semiconductors.
Electronic books.
Handbooks and manuals.
Online Access:Connect to the full text of this electronic book
Description
Summary:Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.
Item Description:Electronic resource.
Physical Description:1 online resource (volumes <1>) : illustrations.
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and index.
ISBN:1591240271
9781591240273
9780815516347
0815516347