Characterization of semiconductor materials : principles and methods /

Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, and Ion/Solid Interactions.

Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: McGuire, G. E.
Format: eBook
Language:English
Published: Park Ridge, N.J. : Noyes Publications, [1989-]
Series:Materials science and process technology series.
Subjects:
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Call Number: QC611.45 .C42 1989eb
 
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QC611.45 .C42 1989eb Available