Design technology co-optimization in the era of sub-resolution IC scaling /

Tackle the challenges facing the most advanced technology nodes in the microelectronics industry with the help of design technology co-optimization (DTCO). This mediation process aims to ensure competitive technology architecture definition while avoiding schedule or yield risks caused by unrealisti...

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Bibliographic Details
Main Authors: Liebmann, Lars W. (Author), Pileggi, Lawrence, 1962- (Author), Vaidyanathan, Kaushik (Author)
Format: eBook
Language:English
Published: Bellingham, Washington : SPIE, [2015]
Series:SPIE Digital Library.
Tutorial texts in optical engineering ; v. TT 104.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:Tackle the challenges facing the most advanced technology nodes in the microelectronics industry with the help of design technology co-optimization (DTCO). This mediation process aims to ensure competitive technology architecture definition while avoiding schedule or yield risks caused by unrealistically aggressive process assumptions. Find the answers in this Tutorial Text, which reviews the fundamental design objectives as well as the resulting topological constraints of a standard cell logic design flow; cell design, placement, and routing are examined against the backdrop of ever-increasing design constraints in advanced technology nodes.
Item Description:"SPIE Digital Library."--Website.
Physical Description:1 online resource (160 pages).
Also available in print version.
Format:Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader.
Bibliography:Includes bibliographical references and index.
ISBN:9781628416695
DOI:10.1117/3.2217861
Access:Restricted to subscribers or individual electronic text purchasers.