Optical scattering : measurement and analysis /
The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and partic...
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| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Bellingham, Wash. (1000 20th St. Bellingham WA 98225-6705 USA) :
SPIE,
2012.
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| Edition: | 3rd ed. |
| Series: | SPIE Digital Library.
SPIE monograph ; PM224. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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