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Nanometer-scale defect detection using polarized light /

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Bibliographic Details
Main Author: Dahoo, Pierre Richard
Other Authors: Pougnet, Philippe, El Hami, Abdelkhalak
Format: Book
Language:English
Published: London : Hoboken, N.J. : ISTE ; John Wiley & Sons, 2016.
Series:Reliability of multiphysical systems ; 2.
Subjects:
Materials > Defects > Analysis.
Description
Physical Description:xiv, 296 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:9781848219366
1848219369