Nanometer-scale defect detection using polarized light /

Bibliographic Details
Main Author:	Dahoo, Pierre Richard
Other Authors:	Pougnet, Philippe, El Hami, Abdelkhalak
Format:	Book
Language:	English
Published:	London : Hoboken, N.J. : ISTE ; John Wiley & Sons, 2016.
Series:	Reliability of multiphysical systems ; 2.
Subjects:	Materials > Defects > Analysis.

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