APA (7th ed.) Citation

Dahoo, P. R., Pougnet, P., & El Hami, A. (2016). Nanometer-scale defect detection using polarized light. ISTE ; John Wiley & Sons.

Chicago Style (17th ed.) Citation

Dahoo, Pierre Richard, Philippe Pougnet, and Abdelkhalak El Hami. Nanometer-scale Defect Detection Using Polarized Light. London : Hoboken, N.J.: ISTE ; John Wiley & Sons, 2016.

MLA (9th ed.) Citation

Dahoo, Pierre Richard, et al. Nanometer-scale Defect Detection Using Polarized Light. ISTE ; John Wiley & Sons, 2016.